EI-SCAM: EDA tool for the symbolic and sensitivity analysis of analog/RF circuits and noise assessment of electronic interfaces

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dc.contributorLUIS ABRAHAM SANCHEZ GASPARIANO;48352es
dc.contributor.advisorSánchez Gaspariano, Luis Abraham
dc.contributor.advisorTlelo Cuautle, Esteban
dc.contributor.authorCorona Nieva, Arturo
dc.creatorARTURO CORONA NIEVA;641122es
dc.date.accessioned2018-06-10T22:39:34Z
dc.date.available2018-06-10T22:39:34Z
dc.date.issued2015-09-30
dc.description.statementofresponsibilityEstudianteses
dc.identifier.citationCorona N. A. 2015. EI-SCAM: EDA tool for the symbolic and sensitivity analysis of analog/RF circuits and noise assessment of electronic interfaces. Universidad Politécnica de Puebla. Departamento de Posgrado. Cartel de Simposium.es
dc.identifier.urihttp://repositorio.uppuebla.edu.mx:8080/xmlui/handle/123456789/90
dc.languageIngléses
dc.publisherUniversidad Politécnica de Pueblaes
dc.relationVersión publicadaes
dc.relation.ispartofREPOSITORIO NACIONAL CONACYTes
dc.rightsAcceso Abiertoes
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0es
dc.subject.classificationINGENIERÍA Y TECNOLOGÍAes
dc.titleEI-SCAM: EDA tool for the symbolic and sensitivity analysis of analog/RF circuits and noise assessment of electronic interfaceses
dc.typePóster de congresoes

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