EI-SCAM: EDA tool for the symbolic and sensitivity analysis of analog/RF circuits and noise assessment of electronic interfaces

EI-SCAM: EDA tool for the symbolic and sensitivity analysis of analog/RF circuits and noise assessment of electronic interfaces

Corona Nieva, Arturo
URI: http://repositorio.uppuebla.edu.mx:8080/xmlui/handle/123456789/90
Date: 2015-09-30

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    "Pósters" de los simposium de posgrado
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